منابع مشابه
EVALUATION OFDISLOCATION STRUCTURE AND CRYSTALLITE SIZE IN WORN AL-SI ALLOY BY X-RAY DIFFRACTION
Abstract: powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size anddislocation structures. In this paper the effect of the sliding on the microstructure of A356 in the as-cast and heattreated conditions are studied, The X-ray phase analysis shows that with increasing applied load, the dislocationdensity is increased, whereas the crysta...
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While there are some developments in structure solution and refinement, these represent gradual improvements rather than fundamental leaps in methodology. An exception is the assessment of crystal quality by X-ray diffraction topography using a dedicated solid-state electronic detector; this is an elegant example where the precise physical nature of the crystal has been studied and analyzed. Si...
متن کامل3 Molecular structure from X-ray diffraction
Recent developments in the determination of molecular structures from X-ray diffraction data are discussed. While the problems associated with chemical crystallography using single crystals have largely been solved, those with structure from powders and of macromolecules are still the subjects of active research. New and improved methods in structure determination in both these fields dominated...
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An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...
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Valeri Petkov,1,* Yong Peng,1 Geoff Williams,2 Baohua Huang,3,* Donald Tomalia,3 and Yang Ren4 1Department of Physics, Central Michigan University, Mt. Pleasant, Michigan 48859, USA 2Department of Biology, Central Michigan University, Mt. Pleasant, Michigan 48859, USA 3Dendritic NanoTechnologies, Mt. Pleasant, Michigan 48858, USA 4Advanced Photon Source, Argonne National Laboratory, Argonne, Il...
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ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 1968
ISSN: 0021-8898
DOI: 10.1107/s002188986800539x